Effects of Edge Roughness on Magnetoresistance Signatures in an Artificial Spin Ice System

Presenter and Advisor Information

Minzhao Liu, Illinois Wesleyan University

Submission Type

Event

Faculty Advisor

Narendra Jaggi

Expected Graduation Date

2020

Location

Center for Natural Sciences\

Start Date

4-4-2020 2:00 PM

End Date

4-4-2020 3:00 PM

Disciplines

Education | Physics

Abstract

Artificial spin ice (ASI) systems are certain lattices of individual nanowires that each act like small magnets. The system collectively is ‘frustrated’ in that it cannot reach a unique low energy state. Electrical properties of ASI systems have been explored in depth, and signatures of their magnetoresistance (MR) curves are well understood. The effects of disorder on the magnetization and domain mobility of thin magnetic films and of isolated magnetic nanowires have been studied in detail. In addition, effects of disorder have been well explored for atomically frustrated magnetic materials such as pyrochlores. However, there have been no attempts to understand the relationship between MR characteristics of ASI with disorder and edge roughness. This study attempts to fill that void. We present a simulation study of MR as a function of edge roughness, and report three important changes observed in the MR signatures. We also present a qualitative explanation to these effects based on simulated magnetization profiles of the simulated ASI systems.

This document is currently not available here.

Share

COinS
 
Apr 4th, 2:00 PM Apr 4th, 3:00 PM

Effects of Edge Roughness on Magnetoresistance Signatures in an Artificial Spin Ice System

Center for Natural Sciences\

Artificial spin ice (ASI) systems are certain lattices of individual nanowires that each act like small magnets. The system collectively is ‘frustrated’ in that it cannot reach a unique low energy state. Electrical properties of ASI systems have been explored in depth, and signatures of their magnetoresistance (MR) curves are well understood. The effects of disorder on the magnetization and domain mobility of thin magnetic films and of isolated magnetic nanowires have been studied in detail. In addition, effects of disorder have been well explored for atomically frustrated magnetic materials such as pyrochlores. However, there have been no attempts to understand the relationship between MR characteristics of ASI with disorder and edge roughness. This study attempts to fill that void. We present a simulation study of MR as a function of edge roughness, and report three important changes observed in the MR signatures. We also present a qualitative explanation to these effects based on simulated magnetization profiles of the simulated ASI systems.